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LiteScope™It is a unique scanning probe microscope（SPM）Easy to integrate into various scanning electron microscopes（SEM）In the middle. complementarySPMandSEMThe combination of technology（CPEM）Complex sample analysis can be conducted, including characterization of surface morphology, mechanical properties, electrical properties, chemical composition, magnetism, etc.It can also be combined with other scanning electron microscope attachments, such as focused ion beams（FIB）Or gas injection system(GIS）Used for nanotechnology/The preparation and surface modification of microstructures can facilitate the rapid and simple assembly of structures3DCheck. Meanwhile,SPMandSEM
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